Evaluating physical and electrical properties of high-k (Al2O3, ZrO2, HfO2, TiO2...) and 2D materials (Graphene, MoS2...)
Representative Papers
Advanced Materials 29(47) 1703031 (2017) Solid-State Electronics 127 1 (2017) Physica Status Solidi RRL 9(7) 410 (2015) ACS Applied Materials & Interfaces 6(10) 7910 (2014) |
[High-k Dielectrics]
[2D Materials]
[Poly-Si depletion effect on floating gate of Flash memory]
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Device physics especially on dielectric and interface between dielectric and metal
Representative Papers
IEEE Transactions on Electron Devices 65(2) 660 (2018) Physica Status Solidi RRL 9(7) 410 (2015) ACS Applied Materials & Interfaces 6(23) 21632 (2014) ACS Applied Materials & Interfaces 6(10) 7910 (2014) |
[Electron conduction mechanism analysis on the interface of metal-insulator-metal structure]
[Metal-insulator-metal diode for selector application]
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